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KOREA
PRODUCTS
Business Products KP-A353 : SEE Analysis System
+ Larger photoproduct
Special Features - Soft errors may cause property damage and personal injury.

- The SEE Analysis System is highly portable and configurable system enabling users to test wide variety of devices at different radiation beam facilities.

- The SEE system provides a flexible and adaptable solution for evaluating a wide range of semiconductor products, including memory, system IC, power semiconductor, and SSD.
Key Specifications * Evaluation for Certification
Ensure your semiconductors meet industry standards with our SEE Evaluation System.

* Assessment for Comparative Analysis
Streamline your soft error mitigation process and make informed decisions with the System.

* Early Assessment & Validation
Stay ahead of the curve and make actionable decisions with our System.
Verify the product in advance while you are in development and ensure its readiness for production ramp.
The System can provide information that can help improve the soft error rate.
Get peace of mind with our advanced early assessment and validation solutions.
Contact Details H.Y.LEE
Suwon City Government
241, Hyowon-ro, Paldal-gu, Suwon, Gyeonggi,
Republic of Korea, 16490
Tel: +82-31-228-3102,+82-31-228-2656
Fax: +82-31-369-2031
Email : samsungcradle@gmail.com
Contact Us Once you send us your inquiry including Product number starting with "KP-" as above, we will respond immediately to your questions about product which you have interest in. We appreciate your attention.

H.Y.LEE
Suwon City Government
241, Hyowon-ro, Paldal-gu, Suwon, Gyeonggi,
Republic of Korea, 16490
Tel: +82-31-228-3102, +82-31-228-2656
Fax: +82-31-369-2031
Email : samsungcradle@gmail.com