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- KP-A353 : SEE Analysis System

- - Soft errors may cause property damage and personal injury.
  
  - The SEE Analysis System is highly portable and configurable system enabling users to test wide variety of devices at different radiation beam facilities.
  
  - The SEE system provides a flexible and adaptable solution for evaluating a wide range of semiconductor products, including memory, system IC, power semiconductor, and SSD.
- * Evaluation for Certification
  Ensure your semiconductors meet industry standards with our SEE Evaluation System.
  
  * Assessment for Comparative Analysis
  Streamline your soft error mitigation process and make informed decisions with the System.
  
  * Early Assessment & Validation
  Stay ahead of the curve and make actionable decisions with our System.
  Verify the product in advance while you are in development and ensure its readiness for production ramp.
  The System can provide information that can help improve the soft error rate.
  Get peace of mind with our advanced early assessment and validation solutions.
- B.K.KIM(Mr)
  Suwon City Government
  241, Hyowon-ro, Paldal-gu, Suwon, Gyeonggi,
  Republic of Korea, 16490
  Tel: +82-31-228-2656, 2102,
  Fax: +82-31-224-3711, +82-31-228-3705
  Email : samsungcradle@gmail.com

Once you send us your inquiry including Product number starting with "KP-" as above, we will respond immediately to your questions about product which you have interest in. We appreciate your attention.

B.K.KIM(Mr)
Suwon City Government
241, Hyowon-ro, Paldal-gu, Suwon, Gyeonggi,
Republic of Korea, 16490
Tel: +82-31-228-2656, 2102
Fax: +82-31-369-2031
Email : samsungcradle@gmail.com